Dielectric properties of [(Pb1-xSrx)O.TiO2)]-[2SiO2. B2O3]-[K2O] glass ceramics
| dc.contributor.author | Sahu A.K.; Kumar D.; Parkash O.; Thakur O.P.; Prakash C. | |
| dc.date.accessioned | 2025-05-24T09:55:25Z | |
| dc.description.abstract | Dielectric properties of glass ceramics prepared in the [(Pb1-xSrx)O.TiO2)]-[2SiO2. B2O3]-[K2O] system have been studied. The Curie temperature of crystalline phases has been found to decrease with decreasing Pb2+/Sr2+ ratio in the initial glass. This adds support to the authors' previous findings from XRD peak intensity studies suggesting that the crystallites are in solid solution in the system (Pb1-xSrx)TiO3. | |
| dc.identifier.doi | https://doi.org/10.1179/096797803225004990 | |
| dc.identifier.uri | http://172.23.0.11:4000/handle/123456789/19829 | |
| dc.relation.ispartofseries | British Ceramic Transactions | |
| dc.title | Dielectric properties of [(Pb1-xSrx)O.TiO2)]-[2SiO2. B2O3]-[K2O] glass ceramics |