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Dielectric properties of [(Pb1-xSrx)O.TiO2)]-[2SiO2. B2O3]-[K2O] glass ceramics

dc.contributor.authorSahu A.K.; Kumar D.; Parkash O.; Thakur O.P.; Prakash C.
dc.date.accessioned2025-05-24T09:55:25Z
dc.description.abstractDielectric properties of glass ceramics prepared in the [(Pb1-xSrx)O.TiO2)]-[2SiO2. B2O3]-[K2O] system have been studied. The Curie temperature of crystalline phases has been found to decrease with decreasing Pb2+/Sr2+ ratio in the initial glass. This adds support to the authors' previous findings from XRD peak intensity studies suggesting that the crystallites are in solid solution in the system (Pb1-xSrx)TiO3.
dc.identifier.doihttps://doi.org/10.1179/096797803225004990
dc.identifier.urihttp://172.23.0.11:4000/handle/123456789/19829
dc.relation.ispartofseriesBritish Ceramic Transactions
dc.titleDielectric properties of [(Pb1-xSrx)O.TiO2)]-[2SiO2. B2O3]-[K2O] glass ceramics

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