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Analysis of DRV trade-off in deep sub micron sram technology for low power

dc.contributor.authorSingh S.K.; Kaushik B.K.; Chauhan D.S.; Chaurasia N.K.
dc.date.accessioned2025-05-24T09:20:39Z
dc.description.abstractThis paper presents different Data Retention Voltage (DRV) minimization techniques of six transistors SRAM cell for its proper working in a continuous technology scaling environment and for low power applications. The paper also explains the trade-off of all the techniques to better understand the applications for which those techniques can be utilized. © IDOSI Publications, 2014.
dc.identifier.doihttps://doi.org/10.5829/idosi.wasj.2014.31.01.792
dc.identifier.urihttp://172.23.0.11:4000/handle/123456789/14278
dc.relation.ispartofseriesWorld Applied Sciences Journal
dc.titleAnalysis of DRV trade-off in deep sub micron sram technology for low power

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