Introduction
| dc.contributor.author | Sasamal T.N.; Singh A.K.; Mohan A. | |
| dc.date.accessioned | 2025-05-23T11:31:20Z | |
| dc.description.abstract | The exponential decrease in feature size causes serious challenges in CMOS technology due to oxide thickness, diffusion barriers, power dissipation, and leakage currents, etc. © Springer Nature Singapore Pte Ltd 2020. | |
| dc.identifier.doi | https://doi.org/10.1007/978-981-15-1823-2_1 | |
| dc.identifier.uri | http://172.23.0.11:4000/handle/123456789/13185 | |
| dc.relation.ispartofseries | Studies in Computational Intelligence | |
| dc.title | Introduction |