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Theoretical characterisation of a superlattice avalanche photodiode

dc.contributor.authorPal B.B.; Chakrabarti P.
dc.date.accessioned2025-05-24T09:57:17Z
dc.description.abstractA superlattice avalanche photodiode using III-V materials is expected to be used in long-distance fiberoptic communication systems in the 1.3 to 1.55 μm wavelength range. Theoretical studies have been made on the effective ionization rates of electrons and holes of the device, I-V characteristic and the frequency response characteristic of the AlxGa1-xAs/GaAs superlattice p+-i-n+ structure. It is observed that the α/β ratio of the device increases with the field and the bandwidth of the response curve increases with decrease in the dc multiplication gain. © 1987 Springer-Verlag.
dc.identifier.doihttps://doi.org/10.1007/BF00620596
dc.identifier.urihttp://172.23.0.11:4000/handle/123456789/21944
dc.relation.ispartofseriesApplied Physics A Solids and Surfaces
dc.titleTheoretical characterisation of a superlattice avalanche photodiode

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