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Ghost diffraction: A spatial statistical approach

dc.contributor.author., Manisha
dc.contributor.authorTiwari, Vipin
dc.contributor.authorBisht, Nandan S.
dc.contributor.authorDas, Bhargab
dc.contributor.authorSingh, Rakesh Kumar
dc.date.accessioned2024-02-28T09:53:21Z
dc.date.available2024-02-28T09:53:21Z
dc.date.issued2022-09-17
dc.descriptionThis paper published with affiliation IIT (BHU), Varanasi in open access mode.en_US
dc.description.abstractWe report a new method to reconstruct a two-dimensional object in Ghost diffraction scheme using a spatial statistical optics approach. This is implemented by using a static diffuser rather than a pseudo thermal light source generated with a rotating diffuser as used in conventional ghost imaging systems. The experimental implementation makes use of spatial ergodicity and spatial stationarity for spatially distributed random fields by following an analogy between time average and space average. The ensemble average is replaced by space average under the condition of spatial stationarity and ergodicity. A strategy to realize the Ghost diffraction scheme through spatial intensity correlation with a phase retrieval algorithm permits reconstruction of the transparency.en_US
dc.description.sponsorshipManisha acknowledges fellowship from the IIT (BHU) . Vipin Tiwari would like to acknowledge support from DST-INSPIRE ( IF-170861 ). This work is supported by Science and Engineering Research Board (SERB) India - CORE/2019/000026 and Council of Scientific and Industrial Research (CSIR), India - Grant No 80 (0092)/20/EMR-II .en_US
dc.identifier.issn00304018
dc.identifier.urihttp://localhost:8080/xmlui/handle/123456789/2977
dc.identifier.urihttps://idr-sdlib.iitbhu.ac.in/handle/123456789/2977
dc.language.isoenen_US
dc.publisherElsevier B.V.en_US
dc.relation.ispartofseriesOptics Communications;528
dc.subjectImagingen_US
dc.subjectPhase retrievalen_US
dc.subjectScattering mediaen_US
dc.subjectSpeckleen_US
dc.titleGhost diffraction: A spatial statistical approachen_US
dc.typeArticleen_US

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