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Structural changes and ferroelectric properties of BiFeO3 - PbTiO3 thin films grown via a chemical multilayer deposition method
| dc.contributor.author | Gupta S.; Garg A.; Agrawal D.C.; Bhattacharjee S.; Pandey D. | |
| dc.date.accessioned | 2025-05-24T09:56:15Z | |
| dc.description.abstract | Thin films of (1-x) BiFeO3 -x PbTiO3 (BF-xPT) with x≈0.60 were fabricated on Pt/Si substrates by chemical solution deposition of precursor BF and PT layers alternately in three different multilayer configurations. These multilayer deposited precursor films upon annealing at 700 °C in nitrogen show pure perovskite phase formation. In contrast with the equilibrium tetragonal structure for the overall molar composition of BF:PT | |
| dc.identifier.doi | https://doi.org/10.1063/1.3053773 | |
| dc.identifier.uri | http://172.23.0.11:4000/handle/123456789/20743 | |
| dc.relation.ispartofseries | Journal of Applied Physics | |
| dc.title | Structural changes and ferroelectric properties of BiFeO3 - PbTiO3 thin films grown via a chemical multilayer deposition method |