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Reliability Prediction Methods for Electronic Devices: A State-of-the-art Review
| dc.contributor.author | Kumar V.; Singh L.K.; Tripathi A.K. | |
| dc.date.accessioned | 2025-05-23T11:23:26Z | |
| dc.description.abstract | Today, numerous reliability prediction methods exist for electronic systems. A detailed literature survey is conducted to investigate the various techniques/models to ensure electronic components/system's reliability. Based on such a method's merits and limitations, we recommend using the hybrid model to predict an electronic system's reliability prediction in the distinct development phase of the product life cycle to get higher accuracy. © 2022 IETE. | |
| dc.identifier.doi | https://doi.org/10.1080/02564602.2020.1843552 | |
| dc.identifier.uri | http://172.23.0.11:4000/handle/123456789/9032 | |
| dc.relation.ispartofseries | IETE Technical Review (Institution of Electronics and Telecommunication Engineers, India) | |
| dc.title | Reliability Prediction Methods for Electronic Devices: A State-of-the-art Review |