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Analytical study of the photo-effects on common-source and common-drain microwave oscillators using high pinch-off n-GaAs MESFETs

dc.contributor.authorJit S.; Murty N.V.L.N.
dc.date.accessioned2025-05-24T09:56:01Z
dc.description.abstractA new analytical study of the photo-effects on common-source and common-drain microwave oscillators using a high pinch-off n-GaAs MESFET has been presented in this paper. The gate-area of the MESFET with a transparent/semitransparent metal at Schottky junction is assumed to be illuminated with optical radiation. The changes in the gate-source and gate-drain capacitances by an induced photovoltage across the Schottky junction due to the incident illumination have been utilized to model analytically the photo-dependent output frequency characteristics of the microwave oscillators. It has been observed from the numerical results that the output frequency of the common-source oscillator is highly influenced by the gate-source capacitance whereas that of the common-drain oscillator is sensitive to the change in the gate-drain capacitance. Further, in both of the oscillators, the output frequencies are decreased with the increase in the intensity level of the incident optical illumination. © 2005 Elsevier Ltd. All right reserved.
dc.identifier.doihttps://doi.org/10.1016/j.mejo.2005.07.001
dc.identifier.urihttp://172.23.0.11:4000/handle/123456789/20525
dc.relation.ispartofseriesMicroelectronics Journal
dc.titleAnalytical study of the photo-effects on common-source and common-drain microwave oscillators using high pinch-off n-GaAs MESFETs

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