2-D analytical threshold voltage model for dielectric pocket double-gate junctionless FETs by considering source/drain depletion effect

Abstract

This paper proposes an analytical threshold voltage model for the dielectric pocket double gate (DP-DG) junctionless FETs (JLFETs). The channel potential function has been obtained by solving 2-D Poisson's equation using an evanescent mode analysis with suitable boundary conditions. The potential function has then been used for modeling the threshold voltage to investigate the effects of the DP thickness and length on the short-channel effects of the structure. The effects of source and drain depletion regions have been included for improving the accuracy of the model. The model results of DP-DG JLFETs have been compared with the simulation data obtained from the 2-D TCAD ATLAS device simulator. © 2017 IEEE.