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Frequency dependent characteristics in an ion-implanted photo MESFET

dc.contributor.authorSingh V.K.; Pal B.B.
dc.date.accessioned2025-05-24T09:55:17Z
dc.description.abstractThe possibility of using a MESFET for high speed photodetection and switching has been investigated by various workers. In this paper an attempt is made to theoretically evaluate the effect of a signal modulated optical radiation incident on the transparent or semi-transparent Schottky gate of a MESFET device. It is observed that the modulating frequency changes both the I-V characteristics and the threshold voltage of the ion-implanted Si-MESFET. However, in the microwave frequency range the threshold voltage is found to be almost unchanged with frequency. The effect of the wavelength of radiation is the same as observed earlier [1]. © 1987.
dc.identifier.doihttps://doi.org/10.1016/0038-1101(87)90039-6
dc.identifier.urihttp://172.23.0.11:4000/handle/123456789/19691
dc.relation.ispartofseriesSolid State Electronics
dc.titleFrequency dependent characteristics in an ion-implanted photo MESFET

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