Frequency dependent characteristics in an ion-implanted photo MESFET
| dc.contributor.author | Singh V.K.; Pal B.B. | |
| dc.date.accessioned | 2025-05-24T09:55:17Z | |
| dc.description.abstract | The possibility of using a MESFET for high speed photodetection and switching has been investigated by various workers. In this paper an attempt is made to theoretically evaluate the effect of a signal modulated optical radiation incident on the transparent or semi-transparent Schottky gate of a MESFET device. It is observed that the modulating frequency changes both the I-V characteristics and the threshold voltage of the ion-implanted Si-MESFET. However, in the microwave frequency range the threshold voltage is found to be almost unchanged with frequency. The effect of the wavelength of radiation is the same as observed earlier [1]. © 1987. | |
| dc.identifier.doi | https://doi.org/10.1016/0038-1101(87)90039-6 | |
| dc.identifier.uri | http://172.23.0.11:4000/handle/123456789/19691 | |
| dc.relation.ispartofseries | Solid State Electronics | |
| dc.title | Frequency dependent characteristics in an ion-implanted photo MESFET |