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Exponentiated Weibull distribution approach based inflection S-shaped software reliability growth model

dc.contributor.authorSagar, B.B.
dc.contributor.authorSaket, R.K.
dc.contributor.authorSingh, Col. Gurmit
dc.date.accessioned2020-02-20T07:32:47Z
dc.date.available2020-02-20T07:32:47Z
dc.date.issued2015-07-10
dc.description.abstractThe aim of this paper was to estimate the number of defects in software and remove them successfully. This paper incorporates Weibull distribution approach along with inflection S-shaped Software Reliability Growth Models (SRGM). In this combination two parameter Weibull distribution methodology is used. Relative Prediction Error (RPE) is calculated to predict the validity criterion of the developed model. Experimental results on actual data from five data sets are compared with two other existing models, which expose that the proposed software reliability growth model predicts better estimation to remove the defects. This paper presents best software reliability growth model with including feature of both Weibull distribution and inflection S-shaped SRGM to estimate the defects of software system, and provide help to researchers and software industries to develop highly reliable software products.en_US
dc.description.sponsorshipBanaras Hindu University BHU Birla Institute of Technology and Science, Pilani Indian Institute of Technology Bombayen_US
dc.identifier.issn20904479
dc.identifier.urihttps://idr-sdlib.iitbhu.ac.in/handle/123456789/643
dc.language.isoen_USen_US
dc.publisherAin Shams Universityen_US
dc.subjectCoefficient of multiple determinationsen_US
dc.subjectMean square fitting erroren_US
dc.subjectRelative prediction erroren_US
dc.subjectReliability approximationen_US
dc.subjectSoftware reliability growth modelen_US
dc.subjectWeibull distributionen_US
dc.titleExponentiated Weibull distribution approach based inflection S-shaped software reliability growth modelen_US
dc.typeArticleen_US

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