Eddy current nondestructive mapping of C/C-SiC composites
| dc.contributor.author | Srivastava V.K.; Udoh A.; Maier H.-P.; Knoch P.; Maile K. | |
| dc.date.accessioned | 2025-05-24T09:56:32Z | |
| dc.description.abstract | Eddy current technique using a C-scan probe coil system has been tested quantitatively in the laboratory for the evaluation of various type of surface irregularities, i.e. surface notch/crack, sub-surface notch/crack, carbon coated surface and oxidized surface of C/C-SiC composite materials. The results show, that the eddy current technique can also be used as a sensitive tool for monitoring defects in C/C-SiC composite materials. | |
| dc.identifier.doi | https://doi.org/10.1007/s10010-003-0124-5 | |
| dc.identifier.uri | http://172.23.0.11:4000/handle/123456789/21112 | |
| dc.relation.ispartofseries | Forschung im Ingenieurwesen/Engineering Research | |
| dc.title | Eddy current nondestructive mapping of C/C-SiC composites |