Design of DRAM sense amplifier using 45nm technology
| dc.contributor.author | Kumar A.; Pandey A.; Sahu P.K.; Chandra L.; Dwivedi R.; Mishra V.N. | |
| dc.date.accessioned | 2025-05-24T09:32:01Z | |
| dc.description.abstract | In very large scale integration (VLSI) circuits, power consumption plays a crucial role to design memory elements and digital systems. This work proposed the power savings in DRAM sense amplifier can be done by using FSPA-VLSA (Foot Switch PMOS Access Voltage Latch Type Sense Amplifier). Applying this technique in open bit architecture of DRAM Cell during read operation, a reduction in overall power consumption has been obtained approximately 81%. The proposed circuit also has advantages in low power VLSI/ULSI design. The circuit has been designed and implemented in Cadence virtuoso tools at 45nm Technology. © 2018 IEEE. | |
| dc.identifier.doi | https://doi.org/10.1109/ISDCS.2018.8379656 | |
| dc.identifier.uri | http://172.23.0.11:4000/handle/123456789/17670 | |
| dc.relation.ispartofseries | 2018 International Symposium on Devices, Circuits and Systems, ISDCS 2018 | |
| dc.title | Design of DRAM sense amplifier using 45nm technology |