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Emergence of Dielectric Properties by Doping of Semi-Transition Metal in Semiconductor Complex Perovskite Oxide

dc.contributor.authorRai V.S.; Prajapati D.; Verma M.K.; Kumar V.; Kumar A.; Das T.; Sahoo K.; Singh N.B.; Mandal K.
dc.date.accessioned2025-05-23T11:18:09Z
dc.description.abstractThe effect of zinc substitution at the Cu2+ site and germanium substitution at the Ti4+ site in bismuth copper titanate, Bi2/3Cu3Ti4O12, is investigated. Composition with x = 0.05 is synthesized by semi-wet route in the system Bi2/3Cu3Ti4−xGexO12 (BCTGO) and Bi2/3Cu3−xZnxTi4−xGexO12 (BCZTGO) that are sintered at 1123 K for 8 h. Crystal structure has remained cubic. The phase formations of these ceramics are confirmed by the X-ray diffraction. The microstructural analysis of the samples is done by scanning electron microscopy and tunneling electron microscopy. Elemental analysis is performed by energy dispersive X-ray spectroscopy. X-ray photoelectron spectroscopy suggests that all elements present in these ceramics are in proper oxidation states. The dielectric constant is found high for BCTGO-0.05 ceramic. The specific capacitances of BCTGO-0.05 and BCZTGO-0.05 are found to be 13.05 and 15.7 F g−1, respectively. Optical band gap values (Eg) of BCTGO-0.05 and BCZTGO-0.05 ceramics are found as 1.77 and 1.91 eV. © 2023 Wiley-VCH GmbH.
dc.identifier.doihttps://doi.org/10.1002/crat.202200236
dc.identifier.urihttp://172.23.0.11:4000/handle/123456789/8179
dc.relation.ispartofseriesCrystal Research and Technology
dc.titleEmergence of Dielectric Properties by Doping of Semi-Transition Metal in Semiconductor Complex Perovskite Oxide

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