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Absence of morphotropic phase boundary effects in BiFeO3- PbTiO3 thin films grown via a chemical multilayer deposition method

dc.contributor.authorGupta, S.
dc.contributor.authorBhattacharjee, S.
dc.contributor.authorPandey, D.
dc.contributor.authorBansal, V.
dc.contributor.authorBhargava, S.K.
dc.contributor.authorPeng, J.L.
dc.contributor.authorGarg, A.
dc.date.accessioned2021-10-06T06:41:32Z
dc.date.available2021-10-06T06:41:32Z
dc.date.issued2011-07
dc.description.abstractWe report an unusual behavior observed in (BiFeO3)1-x -(PbTiO3) x (BF-xPT) thin films prepared using a multilayer chemical solution deposition method. Films of different compositions were grown by depositing several bilayers of BF and PT precursors of varying BF and PT layer thicknesses followed by heat treatment in air. X-ray diffraction showed that samples of all compositions show mixing of two compounds resulting in a single-phase mixture, also confirmed by transmission electron microscopy. In contrast to bulk compositions, samples show a monoclinic (MA-type) structure suggesting disappearance of the morphotropic phase boundary (MPB) at x=0.30 as observed in the bulk. This is accompanied by the lack of any enhancement of the remanent polarization at the MPB, as shown by the ferroelectric measurements. Magnetic measurements showed an increase in the magnetization of the samples with increasing BF content. Significant magnetization in the samples indicates melting of spin spirals in the BF-xPT films, arising from a random distribution of iron atoms. Absence of Fe 2+ ions was corroborated by X-ray photoelectron spectroscopy measurements. The results illustrate that thin film processing methodology significantly changes the structural evolution, in contrast to predictions from the equilibrium phase diagram, besides modifying the functional characteristics of the BP-xPT system dramatically.en_US
dc.description.sponsorshipApplied Physics A: Materials Science and Processingen_US
dc.identifier.issn14320630
dc.identifier.urihttps://idr-sdlib.iitbhu.ac.in/handle/123456789/1759
dc.language.isoenen_US
dc.relation.ispartofseriesIssue 1;Volume 104
dc.subjectthin films;en_US
dc.subjectX-ray diffraction;en_US
dc.subjectphotoelectron;en_US
dc.subjectspectroscopyen_US
dc.titleAbsence of morphotropic phase boundary effects in BiFeO3- PbTiO3 thin films grown via a chemical multilayer deposition methoden_US
dc.typeArticleen_US

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