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Structural Analysis Enabled by the Invizo 6000® Large Field-of-View Atom Probe

dc.contributor.authorChen, Yimeng
dc.contributor.authorMartin, Isabelle
dc.contributor.authorProsa, Ty
dc.contributor.authorUlfig, Robert
dc.contributor.authorRice, Katherine P.
dc.contributor.authorLarson, David J.
dc.contributor.authorReinhard, David A.
dc.contributor.authorLenz, Dan
dc.contributor.authorBrewer, Nicholas R.
dc.contributor.authorHolman, Michael
dc.contributor.authorHanna, Jacob
dc.contributor.authorGroth, Gard
dc.contributor.authorPal, Avnish Singh
dc.contributor.authorBasu, Joysurya
dc.date.accessioned2024-04-04T09:49:28Z
dc.date.available2024-04-04T09:49:28Z
dc.date.issued2023-07-22
dc.descriptionThis paper published with affiliation IIT (BHU), Varanasi in open access mode.en_US
dc.identifier.issn14358115
dc.identifier.urihttps://idr-sdlib.iitbhu.ac.in/handle/123456789/3090
dc.language.isoenen_US
dc.publisherNLM (Medline)en_US
dc.relation.ispartofseriesMicroscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada;29
dc.titleStructural Analysis Enabled by the Invizo 6000® Large Field-of-View Atom Probeen_US
dc.typeArticleen_US

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