Request a copy of the file

Enter the following information to request a copy for the following item: Impact of interface trap charges on device level performances of a lateral/vertical gate stacked Ge/Si TFET-on-SELBOX-substrate

Requesting the following file: Impact-of-interface-trap-charges-on-device-level-performances-of-a-lateralvertical-gate-stacked-GeSi-TFETonSELBOXsubstrate2020Applied-Physics-A-Materials-Science-and-Processing.pdf