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Synthesis & characterization of nanostructure VO2 thin film

dc.contributor.authorOjha P.K.; Mishra S.K.
dc.date.accessioned2025-05-23T11:26:53Z
dc.description.abstractVanadium dioxides are strongly correlated systems which undergo an insulator-metal transition (IMT) from a low-temperature semiconducting phase to a high-temperature metallic phase. Among them, Vanadium dioxide (VO2) undergoes IMT close to room temperature, accompanied by a structural transition resulting change of several orders of magnitude in the electrical and optical properties. Here, we present the synthesis of VO2 by sol-gel process which employs cost-effective precursors to synthesize pure phase of VO2 thin films. The synthesized thin films were characterized using an X-ray diffraction (XRD) to confirm phase purity and high resolution scanning electron microscope (HR-SEM) to study the crystallite and particle size for the synthesized films. The film's surface was analyzed by X-ray photoelectron spectroscopy (XPS) to determine the valence state and chemical composition of vanadium dioxide. © Content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence.
dc.identifier.doihttps://doi.org/10.1088/1742-6596/2070/1/012098
dc.identifier.urihttp://172.23.0.11:4000/handle/123456789/10791
dc.relation.ispartofseriesJournal of Physics: Conference Series
dc.titleSynthesis & characterization of nanostructure VO2 thin film

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