Static and quasi-static drain current modeling of tri-gate junctionless transistor with substrate bias-induced effects

Abstract

In this paper, a surface potential-based drain current model is developed to explore the static and quasi-static performance of substrate-biased tri-gate junctionless field-effect-transistors (TGJLFETs). The effects of substrate bias voltage on surface potential, charge density, and drain current are analyzed. The 2-D Poisson's equation is solved to obtain front and back surface potentials incorporating the effect of substrate bias voltage for a long-channel TGJLFET. The front and back surface potentials are subsequently utilized to obtain total conduction charge density and drain current. Further, short-channel and quantum mechanical corrections are incorporated in the model to use it for scaled devices. Moreover, the terminal charges calculated using Ward-Dutton's charge partitioning scheme are utilized to model the transcapacitances and quasi-static drain current for TGJLFET. Further, an equivalent large-signal transient model of the device is implemented in SPICE using Verilog-A, and the transient behavior of inverter and ring oscillator circuits are simulated and studied. The models are validated using a 3-D Visual TCAD device simulator from Cogenda Pvt. Ltd. © 1963-2012 IEEE.