High-temperature relaxor ferroelectric behavior in Pr-doped SrTi O3

Abstract

Temperature-dependent Raman scattering, dielectric, and powder x-ray diffraction studies have been carried out on Pr-doped SrTi O3 ceramic samples. Activation of T O2 and T O4 polar modes indicated increasing degree of polar distortion by Pr doping. Dielectric measurements revealed that the system exhibits dielectric relaxation peaks at ∼500 K. The softening tendency of the polar T O1 soft mode decreases with increasing Pr doping. X-ray diffraction results show no evidence of symmetry breaking across the dielectric peak temperatures. The system exhibits features of high-temperature relaxor ferroelectrics. © 2007 The American Physical Society.