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Analytical modelling of photo-effects on the S-parameters of GaAs MESFETs

dc.contributor.authorMurty Neti.V.L.N.; Jit S.
dc.date.accessioned2025-05-24T09:57:12Z
dc.description.abstractA new analytical model for the photo-dependent S-parameters of GaAs MESFETs has been presented in this paper. The photo-dependent expressions for the gate-source capacitance, gate-drain capacitance, drain-source resistance, domain capacitance, and domain resistance have been derived and used to study the optical effects on the S-parameters of the MESFET. © 2005 Wiley Periodicals, Inc.
dc.identifier.doihttps://doi.org/10.1002/mop.21290
dc.identifier.urihttp://172.23.0.11:4000/handle/123456789/21859
dc.relation.ispartofseriesMicrowave and Optical Technology Letters
dc.titleAnalytical modelling of photo-effects on the S-parameters of GaAs MESFETs

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