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Evolution of phase purity and texture on annealing of BiFeO3 thin film prepared by Sol-gel technique

dc.contributor.authorDash P.; Dash B.N.; Rath H.; Rath C.; Mishra N.C.
dc.date.accessioned2025-05-24T09:55:40Z
dc.description.abstractWe report preparation of phase pure BiFeO3 thin films on glass, ITO and Si(100) substrates through chemical route using spin coating technique. Sol-gel process was adopted to prepare the films using bismuth nitrate and iron nitrate as precursors. X-Ray diffraction and Raman spectroscopy studies revealed amorphous nature of the as deposited films. Rhombohedral crystalline phase of BiFeO3 evolved on annealing the films at 500°C, but with Bi 2Fe4O9 and Bi24Fe2O 39 as impurity phases. Increasing the annealing temperature to 550°C caused a drastic reduction of the impurity phases and at 600°C, the films were phase-pure BiFeO3. Micro Raman spectra showed features consistent with the reported characteristic peaks of BiFeO3 crystalline phase for films annealed at 500 and 550°C. Crystallite size obtained from X-ray diffraction line width analysis are within 30 to 40 nm. Atomic force microscopy (AFM) however showed grain size of ∼192 nm, indicating polycrystalline nature of the grains. © 2009 IACS.
dc.identifier.doihttps://doi.org/10.1007/s12648-009-0008-0
dc.identifier.urihttp://172.23.0.11:4000/handle/123456789/20121
dc.relation.ispartofseriesIndian Journal of Physics
dc.titleEvolution of phase purity and texture on annealing of BiFeO3 thin film prepared by Sol-gel technique

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