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Cd0.2Zn0.8O nanowire thin film transistor for low kickback high-speed AMLCD circuit applications

dc.contributor.authorBinod Kumar B.; Dubey S.; Jit S.; Singh K.
dc.date.accessioned2025-05-23T11:13:38Z
dc.description.abstractThis paper reports the Cd0.2Zn0.8O channel cylindrical gate-all-around nanowire thin-film transistor (CY-GAA-NWTFT) for high-speed active-matrix liquid crystal display (AMLCD) pixel circuit with minimal kickback voltage. The AC/DC, analog, and energy efficiency of this device are investigated against the variation in lateral (channel length) as well as vertical dimension (oxide thickness) using technology computer aided design (TCAD) device simulation environment. Further, the behavior of CY-GAA-TFT is crosschecked by implementing it on resistive load digital inverter circuit followed by transient analysis to calculate delay of the inverter circuit. Moreover, static analysis has been also performed to evaluate its voltage transfer curve (VTC) to derive its noise margin and voltage gain. The execution of the proposed CY-GAA-NWT device on AMLCD pixel circuit indicates tremendous improvement in performance in terms of high-speed applications and low kickback voltage. © 2024 Elsevier Ltd
dc.identifier.doihttps://doi.org/10.1016/j.micrna.2024.207796
dc.identifier.urihttp://172.23.0.11:4000/handle/123456789/6041
dc.relation.ispartofseriesMicro and Nanostructures
dc.titleCd0.2Zn0.8O nanowire thin film transistor for low kickback high-speed AMLCD circuit applications

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