Structure determination of a 40 H polytype of SiC and its intergrowth structures using lattice imaging technique

Abstract

The 40 H polytype of SiC and its intergrowth structure are investigated by X‐ray diffraction technique. Attempt to work out the structure of this polytype gives rise to a space group ambiguity. Information obtained from lattice images are utilized to arrive at the correct structure of 40 H polytype and thereby the space group ambiguity is resolved. Following the imaging code derived from the structure determination of 40 H, it is possible to know the structure of the 222 H polytype. It is found that intergrowth of different structures of medium range periodicities constitute the 222 H structure. Copyright © 1981 WILEY‐VCH Verlag GmbH & Co. KGaA