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Pd/ZnO Nanoparticles Based Schottky Ultraviolet Photodiodes Grown on Sn-Coated n-Si Substrates by Thermal Evaporation Method

dc.contributor.authorSomvanshi D.; Jit S.
dc.date.accessioned2025-05-24T09:20:44Z
dc.description.abstractThis paper reports the ultraviolet (UV) detection characteristics of Pd/ZnO nanoparticles (NPs) based Schottky diodes grown on Sn coated n-Si substrates by thermal evaporation method. The measured current-voltage characteristics of the Pd/ZnO NPs/Sn/n-Si diodes under both the dark and UV illumination at wavelength of 365 nm have been presented for the applied bias voltage varying from -3 to 3 V. The as-fabricated photodiodes show a high-contrast ratio (i.e., the photocurrent to dark current ratio) of ∼541.34, an excellent quantum efficiency of ∼68%, a reasonably good responsivity of ∼0.20 A/W at 365 nm, and -3 V reverse bias voltage at room temperature. © 1995-2012 IEEE.
dc.identifier.doihttps://doi.org/10.1109/JSTQE.2014.2328234
dc.identifier.urihttp://172.23.0.11:4000/handle/123456789/14345
dc.relation.ispartofseriesIEEE Journal of Selected Topics in Quantum Electronics
dc.titlePd/ZnO Nanoparticles Based Schottky Ultraviolet Photodiodes Grown on Sn-Coated n-Si Substrates by Thermal Evaporation Method

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